Transparent Optical Material Characterization Kits
The Z-SCAN Characterization of Transparent Optical Materials Kit is a simple implementation of the z-scan technique that can be used to characterize relatively thin (< 5 mm) optical materials. All of the optics and mounts in this kit have been certified by our Ph.D. scientists in the Newport Technology and Applications Center to work together and be compatible with the Spitfire XP Pro.
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