Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/10, 440-700 nm

The 20Q20NC.1 Broadband Beam Sampler is a 2.0 inch (50.8 mm) diameter, 9.40 mm thick, UV fused silica beam sampler with a λ/10 surface flatness. It is 440-700 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.

Specifications

Technical Specs

Wavelength Range
440-700 nm
Diameter
50.8 mm
Material
UV Grade Fused Silica
Antireflection Coating
NC.1
Angle of Incidence
45°
Damage Threshold
500 W/cm² CW, 5 J/cm² for 10 nsec pulses, typical @ 532 nm
Surface Flatness
≤λ/10 at 632.8 nm over the clear aperture
Surface Quality
15-5 scratch-dig
Diameter Tolerance
+0/-0.13 mm
Thickness
9.4 mm

Thickness Tolerance
±0.38 mm
Wedge
30 ±15 arc min
Clear Aperture
> central 80% of diameter
Chamfers
0.38-1.14 mm face width
Chamfers Angle Tolerance
45° ±15°
Durability
MIL-C-675C, moderate abrasion million cycles
Cleaning
See How to Clean Optics
Substrate Number
20Q20

Wavelength Range
440-700 nm
Diameter
50.8 mm
Material
UV Grade Fused Silica
Antireflection Coating
NC.1
Angle of Incidence
45°
Damage Threshold
500 W/cm² CW, 5 J/cm² for 10 nsec pulses, typical @ 532 nm
Surface Flatness
≤λ/10 at 632.8 nm over the clear aperture
Surface Quality
15-5 scratch-dig
Diameter Tolerance
+0/-0.13 mm
Thickness
9.4 mm

Thickness Tolerance
±0.38 mm
Wedge
30 ±15 arc min
Clear Aperture
> central 80% of diameter
Chamfers
0.38-1.14 mm face width
Chamfers Angle Tolerance
45° ±15°
Durability
MIL-C-675C, moderate abrasion million cycles
Cleaning
See How to Clean Optics
Substrate Number
20Q20

Resources & Downloads

Drawings And Cad

BS-1-DWG-S(72.2 kB, PDF)

Other

20Q20NC.1 RoHS Certificate(0, PDF)
NC.1 Raw Data.xlsx(66.1 kB, XLSX)

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