Optical Beam Sampler, Broadband, UVFS, 50.8 mm, λ/20, 660-1000 nm

The 20Q40NC.2 Broadband Beam Sampler is a 2.0 inch (50.8 mm) diameter, 9.40 mm thick, UV fused silica beam sampler with a λ/20 surface flatness. It is 660 to 1000 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.

Specifications

Technical Specs

Wavelength Range
660-1000 nm
Diameter
50.8 mm
Material
UV Grade Fused Silica
Antireflection Coating
NC.2
Angle of Incidence
45°
Damage Threshold
500 W/cm² CW, 7 J/cm² for 10 nsec pulses, typical @ 780 nm
Surface Flatness
≤λ/20 at 632.8 nm over the clear aperture
Surface Quality
10-2 scratch-dig
Diameter Tolerance
+0/-0.13 mm
Thickness
9.4 mm

Thickness Tolerance
±0.38 mm
Wedge
30 ±15 arc min
Clear Aperture
> central 80% of diameter
Chamfers
0.38-1.14 mm face width
Chamfers Angle Tolerance
45° ±15°
Durability
MIL-C-675C, moderate abrasion million cycles
Cleaning
See How to Clean Optics
Substrate Number
20Q40

Wavelength Range
660-1000 nm
Diameter
50.8 mm
Material
UV Grade Fused Silica
Antireflection Coating
NC.2
Angle of Incidence
45°
Damage Threshold
500 W/cm² CW, 7 J/cm² for 10 nsec pulses, typical @ 780 nm
Surface Flatness
≤λ/20 at 632.8 nm over the clear aperture
Surface Quality
10-2 scratch-dig
Diameter Tolerance
+0/-0.13 mm
Thickness
9.4 mm

Thickness Tolerance
±0.38 mm
Wedge
30 ±15 arc min
Clear Aperture
> central 80% of diameter
Chamfers
0.38-1.14 mm face width
Chamfers Angle Tolerance
45° ±15°
Durability
MIL-C-675C, moderate abrasion million cycles
Cleaning
See How to Clean Optics
Substrate Number
20Q40

Resources & Downloads

Drawings And Cad

BS-1-DWG-S(72.2 kB, PDF)

Other

20Q40NC.2 RoHS Certificate(705.5 kB, PDF)
NC.2 Raw Data.xlsx(73.8 kB, XLSX)

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