UV Broadband Beam Sampler, UVFS, 25.4 mm, λ/10, 255-440 nm
The 10Q20NC.UV Broadband Beam Sampler is a 1.0 inch (25.4 mm) diameter, 6.10 mm thick, UV fused silica beam sampler with a λ/10 surface flatness. It is 255-440 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary. Specifications
Wavelength Range
255-440 nm
Diameter
25.4 mm
Material
UV Grade Fused Silica
Antireflection Coating
NC.UV (Ravg < 1% @ 255-440 nm)
Angle of Incidence
45°
Damage Threshold
1.0 J/cm2 with 10 nsec pulses, 10 Hz @ 266 nm, typical
Surface Flatness
≤λ/10 at 632.8 nm over the clear aperture
Surface Quality
15-5 scratch-dig
Diameter Tolerance
+0/-0.13 mm
Thickness Tolerance
±0.38 mm
Wedge
30 ±15 arc min
Clear Aperture
> central 80% of diameter
Chamfers
0.25-0.76 mm face width
Chamfers Angle Tolerance
45° ±15°
Durability
MIL-C-675C, adhesion, abrasion and solubility
Cleaning
Substrate Number
10Q20
Wavelength Range
255-440 nm
Diameter
25.4 mm
Material
UV Grade Fused Silica
Antireflection Coating
NC.UV (Ravg < 1% @ 255-440 nm)
Angle of Incidence
45°
Damage Threshold
1.0 J/cm2 with 10 nsec pulses, 10 Hz @ 266 nm, typical
Surface Flatness
≤λ/10 at 632.8 nm over the clear aperture
Surface Quality
15-5 scratch-dig
Diameter Tolerance
+0/-0.13 mm
Thickness Tolerance
±0.38 mm
Wedge
30 ±15 arc min
Clear Aperture
> central 80% of diameter
Chamfers
0.25-0.76 mm face width
Chamfers Angle Tolerance
45° ±15°
Durability
MIL-C-675C, adhesion, abrasion and solubility
Cleaning
Substrate Number
10Q20
