UV Broadband Beam Sampler, UVFS, 50.8 mm, λ/10, 255-440 nm

The 20Q20NC.UV Broadband Beam Sampler is a 2.0 inch (50.8 mm) diameter, 9.40 mm thick, UV fused silica beam sampler with a λ/10 surface flatness. It is 255-440 nm anti-reflection coated on the back surface. Our broadband beam samplers are designed to split off or sample a beam by Fresnel reflection for beam monitoring applications where minimum disturbance of the transmitted beam is necessary.

Specifications

Technical Specs

Wavelength Range
255-440 nm
Diameter
50.8 mm
Material
UV Grade Fused Silica
Antireflection Coating
NC.UV (R_avg < 1% @ 255-440 nm)
Angle of Incidence
45°
Damage Threshold
1.0 J/cm² with 10 nsec pulses, 10 Hz @ 266 nm, typical
Surface Flatness
≤λ/10 at 632.8 nm over the clear aperture
Surface Quality
15-5 scratch-dig
Diameter Tolerance
+0/-0.13 mm

Thickness Tolerance
±0.38 mm
Wedge
30 ±15 arc min
Clear Aperture
> central 80% of diameter
Chamfers
0.25-0.76 mm face width
Chamfers Angle Tolerance
45° ±15°
Durability
MIL-C-675C, adhesion, abrasion and solubility
Cleaning
See How to Clean Optics
Substrate Number
10Q20

Wavelength Range
255-440 nm
Diameter
50.8 mm
Material
UV Grade Fused Silica
Antireflection Coating
NC.UV (R_avg < 1% @ 255-440 nm)
Angle of Incidence
45°
Damage Threshold
1.0 J/cm² with 10 nsec pulses, 10 Hz @ 266 nm, typical
Surface Flatness
≤λ/10 at 632.8 nm over the clear aperture
Surface Quality
15-5 scratch-dig
Diameter Tolerance
+0/-0.13 mm

Thickness Tolerance
±0.38 mm
Wedge
30 ±15 arc min
Clear Aperture
> central 80% of diameter
Chamfers
0.25-0.76 mm face width
Chamfers Angle Tolerance
45° ±15°
Durability
MIL-C-675C, adhesion, abrasion and solubility
Cleaning
See How to Clean Optics
Substrate Number
10Q20

Resources & Downloads

3D Product Models

2D Product Drawings

BS-1-DWG-S(72.2 kB, PDF)

Other

20Q20NC.UV RoHS Certificate(0, PDF)
20Q20NC.UV_ROHS2-2021.pdf(279.2 kB, PDF)

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